MV-SC6500, MV-SC6500-AI-WID smart camera
The MV-SC6500-AI-WID is a Semiconductor OCR smart camera that features advanced AI for wafer ID recognition and multiple lighting methods, designed for high-performance industrial applications.
Features:
- Advanced AI recognition for wafer ID information
- High-performance embedded computing platform
- Supports multiple lighting methods and over 140 algorithms
- Multiple interface compatibility: display, keyboard, mouse, and multi-channel I/O
- High-speed communication protocols including TCP, UDP, ModBus, and Ethernet/IP
- Durable design with robust 15-pin socket connector from Amphenol Industrial
Manufacturer: HIKROBOT
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Datasheet
Description
Specifications
Applications
Downloads
Similar Products
MV-SC6500 - Description
The MV-SC6500-AI-WID Smart Camera is an advanced imaging tool tailored for wafer recognition in industrial settings. Specifically designed to excel in reading SEMI fonts, QR codes, and OCR codes on various wafer types, this integrated product ensures accurate and efficient identification even amidst challenging conditions such as character blur or severe reflection. Equipped with a specialized AI recognition algorithm, it achieves an ultra-high reading rate of up to 36,000 pieces per hour with a remarkable accuracy rate exceeding 99.9%.
This smart camera boasts a high-performance embedded platform, enabling rapid processing and excellent efficiency with its powerful CPU. It features a CMOS sensor with a global shutter, achieving a resolution of 1408x1024 and a maximum frame rate of 60 fps, ensuring clear and dynamic image capture. The camera supports an advanced optical imaging system with multiple lighting methods, such as bright field and dark field lighting, tailored for various inspection requirements. Connectivity is enhanced by multiple interfaces including Gigabit Ethernet, and it supports a wide range of communication protocols like TCP, UDP, and EtherNet/IP, making it highly adaptable to different industrial setups.
Dimension:
MV-SC6500 - Specifications
| Software Platform | Vision Master |
| Series | SC6000 |
| Existence Tools | Pattern Existence |
| Spot Existence | |
| Edge Existence | |
| Circle Existence | |
| Line Existence | |
| Counting Tools | Pattern Count |
| Spot Count | |
| Edge Count | |
| Measurement Tools | Brightness Analysis |
| Contrast Measurement | |
| Greyscale Size | |
| Diameter Measurement | |
| Width Measurement | |
| Line Angle | |
| Line to Line Angle | |
| Point to Line | |
| Color Size | |
| Edge Width Measurement | |
| Brightness Average Value | |
| Distance Detection | |
| Recognition Tools | OCR |
| Barcode | |
| Color Recognition | |
| Color Contrast | |
| Code Recognition | |
| DL Object Detection | |
| DL Classification | |
| Deep Learning / AI | Feature Matching |
| Fixture | |
| Blob Detection | |
| Character Location | |
| Classification | |
| Object Detection | |
| Character Recognition | |
| Defect Detection | |
| Mono/Color | Mono |
| Communication | Ethernet/IP |
| Profinet | |
| Modbus | |
| FTP | |
| Digital I/O | |
| Serial Port | |
| TCP Client/Server | |
| UDP Server | |
| RS-232 | |
| Memory | 8 GB |
| Storage | 64 GB |
| Power Supply | 24 VDC |
MV-SC6500 - Applications
- Wafer ID Reading: Can be integrated into automated wafer processing system, applied to the identification and tracing of wafer information, wafer position detection, and edge defect detection.
- Automated Inspection Systems: Can be integrated into assembly lines to provide real-time, high-resolution imaging for continuous monitoring and assessment.
- Industrial Automation: Enhances the capabilities of robotic systems by providing accurate visual inputs for decision-making processes.
MV-SC6500 - Downloads
MV-SC6500-AI-WID Smart Camera datasheet Datasheet |
MV-SC6500 - Similar Products
- Adopts AI deep learning algorithm to achieve OCR, object recognition, defect detection, etc.
- Integrates VM functions and supports more than 140 algorithms.
- Adopts multiple interfaces and supports multiple-channel I/O, light source, display, etc.
- Adopts high-performance CPU with faster calculation performance and high efficiency
| Software Platform | Vision Master |
| Series | SC6000 |
| Resolution | 5 MP |
| Existence Tools | Pattern Existence, Spot Existence, Edge Existence, Circle Existence, Line Existence |
| Counting Tools | Pattern Count, Spot Count, Edge Count |
| Measurement Tools | Brightness Analysis, Contrast Measurement, Greyscale Size, Diameter Measurement, Width Measurement, Line Angle, Line to Line Angle, Point to Line, Color Size, Edge Width Measurement, Brightness Average Value, Distance Detection |
- Adopts AI deep learning algorithm to achieve OCR, object recognition, defect detection, etc.
- Supports multiple communication protocols.
- Adopts high-performance CPU with faster calculation performance and high efficiency.
- Supports indicators displaying device status for easy debugging and maintenance.
| Software Platform | Vision Master |
| Series | SC6000 |
| Resolution | 5 MP |
| Existence Tools | Pattern Existence, Spot Existence, Edge Existence, Circle Existence, Line Existence |
| Counting Tools | Pattern Count, Spot Count, Edge Count |
| Measurement Tools | Brightness Analysis, Contrast Measurement, Greyscale Size, Diameter Measurement, Width Measurement, Line Angle, Line to Line Angle, Point to Line, Color Size, Edge Width Measurement, Brightness Average Value, Distance Detection |
- Adopts AI deep learning algorithm to achieve OCR, object recognition, defect detection, etc.
- Supports multiple communication protocols.
- Supports indicators displaying device status for easy debugging and maintenance.
- Adopts high-performance CPU with faster calculation performance and high efficiency.
| Software Platform | Vision Master |
| Series | SC6000 |
| Resolution | 25 MP |
| Existence Tools | Pattern Existence, Spot Existence, Edge Existence, Circle Existence, Line Existence |
| Counting Tools | Pattern Count, Spot Count, Edge Count |
| Measurement Tools | Brightness Analysis, Contrast Measurement, Greyscale Size, Diameter Measurement, Width Measurement, Line Angle, Line to Line Angle, Point to Line, Color Size, Edge Width Measurement, Brightness Average Value, Distance Detection |
- Adopts AI deep learning algorithm to achieve OCR, object recognition, defect detection, etc.
- Integrates VM functions and supports more than 140 algorithms.
- Adopts multiple interfaces and supports multiple-channel I/O, light source, display, etc.
- Adopts high-performance CPU with faster calculation performance and high efficiency.
| Software Platform | Vision Master |
| Series | SC6000 |
| Resolution | 1.6 MP |
| Existence Tools | Pattern Existence, Spot Existence, Edge Existence, Circle Existence, Line Existence |
| Counting Tools | Pattern Count, Spot Count, Edge Count |
| Measurement Tools | Brightness Analysis, Contrast Measurement, Greyscale Size, Diameter Measurement, Width Measurement, Line Angle, Line to Line Angle, Point to Line, Color Size, Edge Width Measurement, Brightness Average Value, Distance Detection |
- Adopts AI deep learning algorithm to achieve OCR, object recognition, defect detection, etc.
- Integrates VM functions and supports more than 140 algorithms.
- Adopts multiple interfaces and supports multiple-channel I/O, light source, display, etc.
- Supports multiple communication protocols.
- Supports indicators displaying device status
- for easy debugging and maintenance.
| Software Platform | Vision Master |
| Series | SC6000 |
| Resolution | 1.6 MP |
| Existence Tools | Pattern Existence, Spot Existence, Edge Existence, Circle Existence, Line Existence |
| Counting Tools | Pattern Count, Spot Count, Edge Count |
| Measurement Tools | Brightness Analysis, Contrast Measurement, Greyscale Size, Diameter Measurement, Width Measurement, Line Angle, Line to Line Angle, Point to Line, Color Size, Edge Width Measurement, Brightness Average Value, Distance Detection |